Publication:
Impact of nitridation on recoverable and permanent NBTI degradation in high-k/metal-gate pMOSFETs
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1850 since deposited on 2021-10-17
Acq. date: 2026-10-13
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Statistics
Views
1850 since deposited on 2021-10-17
Acq. date: 2026-10-13
Citations