Capacitance-voltage characterization of GaAs-Oxide interfaces

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Authors

Brammertz, Guy; Lin, Dennis; Martens, Koen; Mercier, David; Merckling, Clement; Penaud, Julien; Adelmann, Christoph; Sioncke, Sonja; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc

ISSN

0013-4651

Issue

12

Journal

Journal of the Electrochemical Society

Volume

155

Title

Capacitance-voltage characterization of GaAs-Oxide interfaces

Publication type

Journal article

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