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Hot electron degradation of the DC and microwave performance of InAlAs/InGaAs/InP HEMTs

dc.contributor.authorMenozzi, R
dc.contributor.authorBorgarino, M.
dc.contributor.authorBaeyens, Yves
dc.contributor.authorVan Hove, Marleen
dc.contributor.authorFantini, F.
dc.date.accessioned2021-09-29T15:13:36Z
dc.date.available2021-09-29T15:13:36Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1346
dc.sourceIIOimport
dc.titleHot electron degradation of the DC and microwave performance of InAlAs/InGaAs/InP HEMTs
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1009
dc.source.endpage1012
dc.source.conferenceProceedings of the 26th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate9/09/1996
dc.source.conferencelocationBologna Italy
imec.availabilityPublished - open access


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