dc.contributor.author | Cho, Moon Ju | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Zahid, Mohammed | |
dc.contributor.author | Govoreanu, Bogdan | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Van Houdt, Jan | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-17T06:31:58Z | |
dc.date.available | 2021-10-17T06:31:58Z | |
dc.date.issued | 2008-12 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13520 | |
dc.source | IIOimport | |
dc.title | How far can we analyze oxide traps spatially with charge injection techniques? | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Govoreanu, Bogdan | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.source.peerreview | no | |
dc.source.conference | 39th IEEE Semiconductor Interface Specialists Conference | |
dc.source.conferencedate | 11/12/2008 | |
dc.source.conferencelocation | San Diego, CA USA | |
imec.availability | Published - imec | |