Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Conference contributions
View item
imec Publications Repository
imec Publications
Conference contributions
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
How far can we analyze oxide traps spatially with charge injection techniques?
Metadata
Show full item record
Authors
Cho, Moon Ju
;
Degraeve, Robin
;
Roussel, Philippe
;
Zahid, Mohammed
;
Govoreanu, Bogdan
;
Kaczer, Ben
;
Van Houdt, Jan
;
Groeseneken, Guido
Conference
39th IEEE Semiconductor Interface Specialists Conference
Title
How far can we analyze oxide traps spatially with charge injection techniques?
Publication type
Meeting abstract
Collections
Conference contributions
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login