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How far can we analyze oxide traps spatially with charge injection techniques?
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How far can we analyze oxide traps spatially with charge injection techniques?
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Date
2008-12
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cho, Moon Ju
;
Degraeve, Robin
;
Roussel, Philippe
;
Zahid, Mohammed
;
Govoreanu, Bogdan
;
Kaczer, Ben
;
Van Houdt, Jan
;
Groeseneken, Guido
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1913
since deposited on 2021-10-17
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Acq. date: 2025-12-15
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Views
1913
since deposited on 2021-10-17
3
last month
Acq. date: 2025-12-15
Citations