Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
How far can we analyze oxide traps spatially with charge injection techniques?
Publication:
How far can we analyze oxide traps spatially with charge injection techniques?
Copy permalink
Date
2008
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cho, Moon Ju
;
Degraeve, Robin
;
Roussel, Philippe
;
Zahid, Mohammed
;
Govoreanu, Bogdan
;
Kaczer, Ben
;
Van Houdt, Jan
;
Groeseneken, Guido
Journal
Abstract
Description
Statistics
Views
1921
since deposited on 2021-10-17
Acq. date: 2026-07-17
Citations
Statistics
Views
1921
since deposited on 2021-10-17
Acq. date: 2026-07-17
Citations