Publication:

Wafer level characterization and failure analysis of microsensors

Date

2008

Meeting abstract

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Author(s)

De Wolf, Ingrid

;

De Coster, Jeroen

;

Varela Pedreira, Olalla

;

Haspeslagh, Luc

;

Statistics

1999 since deposited on 2021-10-17

Acq. date: 2026-02-26