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Wafer level characterization and failure analysis of microsensors

dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorDe Coster, Jeroen
dc.contributor.authorVarela Pedreira, Olalla
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorWitvrouw, Ann
dc.date.accessioned2021-10-17T06:48:38Z
dc.date.available2021-10-17T06:48:38Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13629
dc.sourceIIOimport
dc.titleWafer level characterization and failure analysis of microsensors
dc.typeMeeting abstract
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorDe Coster, Jeroen
dc.contributor.imecauthorVarela Pedreira, Olalla
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.source.peerreviewno
dc.source.beginpage144
dc.source.endpage147
dc.source.conference7th IEEE Conference on Sensors
dc.source.conferencedate26/10/2008
dc.source.conferencelocationLecce Italy
imec.availabilityPublished - imec


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