dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Cho, Moon Ju | |
dc.contributor.author | Govoreanu, Bogdan | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Zahid, Mohammed | |
dc.contributor.author | Van Houdt, Jan | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-17T06:50:50Z | |
dc.date.available | 2021-10-17T06:50:50Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13642 | |
dc.source | IIOimport | |
dc.title | Trap spectroscopy by charge injection and sensing (TSCIS): a quantitative electrical technique for studying defects in dielectric stacks | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Govoreanu, Bogdan | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Van Houdt, Jan | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 775 | |
dc.source.endpage | 778 | |
dc.source.conference | Technical Digest International Electron Devices Meeting - IEDM | |
dc.source.conferencedate | 15/12/2008 | |
dc.source.conferencelocation | San Francisco, CA USA | |
imec.availability | Published - open access | |