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Trap spectroscopy by charge injection and sensing (TSCIS): a quantitative electrical technique for studying defects in dielectric stacks
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1912 since deposited on 2021-10-17
2last month
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Acq. date: 2026-01-07
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1912 since deposited on 2021-10-17
2last month
1last week
Acq. date: 2026-01-07
Citations