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Trap spectroscopy by charge injection and sensing (TSCIS): a quantitative electrical technique for studying defects in dielectric stacks
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1923 since deposited on 2021-10-17
5last month
Acq. date: 2026-08-25
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Statistics
Views
1923 since deposited on 2021-10-17
5last month
Acq. date: 2026-08-25
Citations