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Trap spectroscopy by charge injection and sensing (TSCIS): a quantitative electrical technique for studying defects in dielectric stacks
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1911 since deposited on 2021-10-17
2last month
Acq. date: 2025-12-15
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Metrics
Views
1911 since deposited on 2021-10-17
2last month
Acq. date: 2025-12-15
Citations