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Emerging yield and reliability challenges in nanometer CMOS technologies

dc.contributor.authorGielen, Georges
dc.contributor.authorDe Wit, Pieter J.H.
dc.contributor.authorMaricau, Elie
dc.contributor.authorLoeckx, J.
dc.contributor.authorMartin-Martinez, Jose
dc.contributor.authorKaczer, Ben
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorRodriguez, Rosanna
dc.contributor.authorNafria, Montserrat
dc.date.accessioned2021-10-17T07:15:57Z
dc.date.available2021-10-17T07:15:57Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13770
dc.sourceIIOimport
dc.titleEmerging yield and reliability challenges in nanometer CMOS technologies
dc.typeProceedings paper
dc.contributor.imecauthorGielen, Georges
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1322
dc.source.endpage1327
dc.source.conferenceDesign Automation and Test in Europe Conference - DATE
dc.source.conferencedate10/03/2008
dc.source.conferencelocationMünchen Germany
dc.identifier.urlhttp://ieeexplore.ieee.org/iel5/4475437/4484624/04484862.pdf?tp=&arnumber=4484862&isnumber=4484624
imec.availabilityPublished - imec


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