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ESD sensitivity of 65-nm fully depleted SOI MOSFETs with different strain-inducing techniques
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Authors
Griffoni, A.
;
Tazzoli, A.
;
Gerardin, S.
;
Simoen, Eddy
;
Claeys, Cor
;
Meneghesso, G.
Conference
2nd International Electrostatic Discharge Workshop
Title
ESD sensitivity of 65-nm fully depleted SOI MOSFETs with different strain-inducing techniques
Publication type
Oral presentation
Embargo date
9999-12-31
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