Publication:

ESD sensitivity of 65-nm fully depleted SOI MOSFETs with different strain-inducing techniques

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1947 since deposited on 2021-10-17
3last month
2last week
Acq. date: 2026-08-06

Citations

Statistics

Views

1947 since deposited on 2021-10-17
3last month
2last week
Acq. date: 2026-08-06

Citations