Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays

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Authors
Griffoni, Alessio; Silvestri, Marco; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Kaczer, Ben; de Potter de ten Broeck, Muriel; Verbeeck, Rita; Nackaerts, Axel
Conference
8th European Workshop on Radiation Effects on Components and Systems - RADECS
Title
Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays
Publication type
Proceedings paper
Embargo date
9999-12-31
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