Publication:

Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays

Date

2008

Proceedings Paper

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Files

17958.pdf 182.83 KB

Author(s)

Griffoni, Alessio

;

Silvestri, Marco

;

Gerardin, Simone

;

Meneghesso, Gaudenzio

;

Paccagnella, Alessandro

;

;

de Potter de ten Broeck, Muriel

;

;

Nackaerts, Axel

Statistics

2025 since deposited on 2021-10-17

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Acq. date: 2026-08-25