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Reliability issues in MuGFET nanodevices

dc.contributor.authorGroeseneken, Guido
dc.contributor.authorCrupi, Felice
dc.contributor.authorShickova, Adelina
dc.contributor.authorThijs, Steven
dc.contributor.authorLinten, Dimitri
dc.contributor.authorKaczer, Ben
dc.contributor.authorCollaert, Nadine
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-17T07:26:41Z
dc.date.available2021-10-17T07:26:41Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13817
dc.sourceIIOimport
dc.titleReliability issues in MuGFET nanodevices
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage52
dc.source.endpage60
dc.source.conferenceIEEE International Reliability Physics Symposium Proceeding - IRPS
dc.source.conferencedate27/04/2008
dc.source.conferencelocationPhoenix, AZ USA
imec.availabilityPublished - open access


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