dc.contributor.author | Hendrickx, Eric | |
dc.contributor.author | Tritchkov, Alexander | |
dc.contributor.author | Sakajiri, Kyohei | |
dc.contributor.author | Granik, Yuri | |
dc.contributor.author | Kempsell, Monica | |
dc.contributor.author | Vandenberghe, Geert | |
dc.date.accessioned | 2021-10-17T07:36:24Z | |
dc.date.available | 2021-10-17T07:36:24Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13857 | |
dc.source | IIOimport | |
dc.title | Hyper-NA imaging of 45nm node random CH layouts using inverse lithography | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Hendrickx, Eric | |
dc.contributor.imecauthor | Vandenberghe, Geert | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 68240L | |
dc.source.conference | Optical Microlithography XXI | |
dc.source.conferencedate | 24/02/2008 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings of SPIE; vol. 6924 | |