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Extreme voltage and current overshoots in HV snapback devices during HBM ESD stress

dc.contributor.authorLinten, Dimitri
dc.contributor.authorVashchenko, Vlad
dc.contributor.authorScholz, Mirko
dc.contributor.authorJansen, Philippe
dc.contributor.authorLafonteese, David
dc.contributor.authorThijs, Steven
dc.contributor.authorSawada,
dc.contributor.authorHasebe,
dc.contributor.authorHopper, Peter
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-17T08:25:47Z
dc.date.available2021-10-17T08:25:47Z
dc.date.issued2008-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14044
dc.sourceIIOimport
dc.titleExtreme voltage and current overshoots in HV snapback devices during HBM ESD stress
dc.typeProceedings paper
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.source.peerreviewyes
dc.source.beginpage204
dc.source.endpage210
dc.source.conference30th EOS/ESD Symposium
dc.source.conferencedate7/09/2008
dc.source.conferencelocationTucson, AZ USA
imec.availabilityPublished - imec


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