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Exploring double patterning approaches for 22-nm half-pitch gate structures
Publication:
Exploring double patterning approaches for 22-nm half-pitch gate structures
Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Locorotondo, Sabrina
;
Vangoidsenhoven, Diziana
;
Wouters, Johan M. D.
;
Miller, Andy
;
Demand, Marc
;
Boullart, Werner
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1941
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1941
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations