Authors

Maji, D.; Crupi, F.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor; Rao, V.R.

ISSN

0003-6951

Issue

16

Journal

Applied Physics Letters

Volume

92

Title

On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO2/SiO2 gate stack

Publication type

Journal article

Embargo date

9999-12-31