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Preliminary reliability assessment of GaN-on-Si HEMT using in-situ Si3N4 cap layer
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Authors
Marcon, Denis
;
Lorenz, Anne
;
Derluyn, Joff
;
Das, Jo
;
Medjdoub, Farid
;
Cheng, Kai
;
Degroote, Stefan
;
Leys, Maarten
;
Mertens, Robert
;
Germain, Marianne
;
Borghs, Gustaaf
Conference
17th European Heterostructure Technology Workshop - HETECH
Title
Preliminary reliability assessment of GaN-on-Si HEMT using in-situ Si3N4 cap layer
Publication type
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