Authors

Merelle, Thomas; Curatola, Gilberto; Nackaerts, Axel; Collaert, Nadine; Van Dal, Mark; Doornbos, Gerben; Doorn, T.S.; Christie, Phillip; Vellianitis, Georgios; Duriez, Blandine; Duffy, Ray; Pawlak, Bartek; Voogt, F.C.; Rooyackers, Rita; Witters, Liesbeth; Jurczak, Gosia; Lander, Rob

Conference

Technical Digest International Electron Devices Meeting - IEDM

Title

First observation of FinFET specific mismatch behavior and optimization guidelines for SRAM scaling

Publication type

Proceedings paper

Embargo date

9999-12-31