dc.contributor.author | Milenin, Alexey | |
dc.contributor.author | de Marneffe, Jean-Francois | |
dc.contributor.author | Struyf, Herbert | |
dc.contributor.author | Boullart, Werner | |
dc.date.accessioned | 2021-10-17T09:02:59Z | |
dc.date.available | 2021-10-17T09:02:59Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14168 | |
dc.source | IIOimport | |
dc.title | In-situ spatial analysis of RF voltage during plasma etching | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Milenin, Alexey | |
dc.contributor.imecauthor | de Marneffe, Jean-Francois | |
dc.contributor.imecauthor | Struyf, Herbert | |
dc.contributor.imecauthor | Boullart, Werner | |
dc.contributor.orcidimec | Milenin, Alexey::0000-0003-0747-0462 | |
dc.contributor.orcidimec | Boullart, Werner::0000-0001-7614-2097 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 17 | |
dc.source.endpage | 22 | |
dc.source.conference | Plasma Processing 17 | |
dc.source.conferencedate | 18/05/2008 | |
dc.source.conferencelocation | Phoenix, AZ USA | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Transactions; Vol. 13; Issue 8 | |