dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | De Jaeger, Brice | |
dc.contributor.author | Leys, Frederik | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Martens, Koen | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Brunco, David | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Shamiryan, Denis | |
dc.contributor.author | Vandeweyer, Tom | |
dc.contributor.author | Winderickx, Gillis | |
dc.contributor.author | Vrancken, Evi | |
dc.contributor.author | De Meyer, Kristin | |
dc.contributor.author | Caymax, Matty | |
dc.contributor.author | Pantisano, Luigi | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-10-17T09:05:40Z | |
dc.date.available | 2021-10-17T09:05:40Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14176 | |
dc.source | IIOimport | |
dc.title | Record Ion/Ioff performance for 65nm Ge pMOSFET and novel Si passivation scheme for improved EOT scalability | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | De Jaeger, Brice | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | Martens, Koen | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Vandeweyer, Tom | |
dc.contributor.imecauthor | Winderickx, Gillis | |
dc.contributor.imecauthor | Vrancken, Evi | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.contributor.orcidimec | Martens, Koen::0000-0001-7135-5536 | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 873 | |
dc.source.endpage | 876 | |
dc.source.conference | Technical Digest International Electron Devices Meeting - IEDM | |
dc.source.conferencedate | 15/12/2008 | |
dc.source.conferencelocation | San Francisco, CA USA | |
imec.availability | Published - open access | |