Publication:
In situ interface and surface characterization of Ge passivated III-V substrates for high-k oxide deposition
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1858 since deposited on 2021-10-17
Acq. date: 2025-10-30
Citations
Metrics
Views
1858 since deposited on 2021-10-17
Acq. date: 2025-10-30
Citations