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In situ interface and surface characterization of Ge passivated III-V substrates for high-k oxide deposition
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In situ interface and surface characterization of Ge passivated III-V substrates for high-k oxide deposition
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Date
2008
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Molle, Alessandro
;
Spiga, Sabina
;
Fanciulli, Marco
;
Brammertz, Guy
;
Meuris, Marc
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1861
since deposited on 2021-10-17
3
last month
Acq. date: 2025-12-10
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Metrics
Views
1861
since deposited on 2021-10-17
3
last month
Acq. date: 2025-12-10
Citations