Development of easy-to-use surface passivation schemes for lifetime measurements on monocrystalline Si with (100)-orientation

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Authors
Poortmans, Jef; Vermeulen, Tom; Nijs, Johan; Mertens, Robert
Conference
Conference Record of the 25th IEEE Photovoltaic Specialists Conference
Title
Development of easy-to-use surface passivation schemes for lifetime measurements on monocrystalline Si with (100)-orientation
Publication type
Proceedings paper
Embargo date
9999-12-31
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