Authors

O'Connor, Robert; Chang, Vincent; Pantisano, Luigi; Ragnarsson, Lars-Ake; Aoulaiche, Marc; O'Sullivan, Barry; Adelmann, Christoph; Van Elshocht, Sven; Lehnen, Peer; Yu, HongYu; Groeseneken, Guido

Conference

IEEE International Reliability Physics Symposium Proceedings

Title

Anomalous positive-bias temperature instability of high-k/metal gate nMOSFET devices with Dy2O3 capping

Publication type

Proceedings paper

Embargo date

9999-12-31