Fundamentals and extraction of velocity saturation in sub-100nm (110)-Si and (100)-Ge

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Authors
Pantisano, Luigi; Trojman, Lionel; Mitard, Jerome; De Jaeger, Brice; Severi, Simone; Eneman, Geert; Crupi, G.; Hoffmann, Thomas Y.; Ferain, Isabelle; Meuris, Marc; Heyns, Marc
Conference
Symposium on VLSI Technology. Digest of Technical Papers
Title
Fundamentals and extraction of velocity saturation in sub-100nm (110)-Si and (100)-Ge
Publication type
Proceedings paper
Embargo date
9999-12-31
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