Authors

Pavanello, M. A.; Martino, J. A.; Simoen, Eddy; Rooyackers, Rita; Collaert, Nadine; Claeys, Cor

Conference

EUROSOI Workshop Proceedings: 4th Workshop of the Thematic Network on Silicon-on-Insulator Technology, Devices and Circuits

Title

Comparison between analog performance of standard and strained triple-gate nFinFETs

Publication type

Proceedings paper

Embargo date

9999-12-31