Authors

Rafi, J.M.; Cardona-Safont, L.; Zabala, M.; Boulord, C.; Campabadal, F.; Pellegrini, G.; Lozano, M.; Simoen, Eddy; Claeys, Cor

Conference

Gettering and Defect Engineering in Semiconductor Technology XII

Title

Evaluation of surface passivation layers for bulk lifetime estimation of high resistivity silicon for radiation detectors

Publication type

Proceedings paper

Embargo date

9999-12-31