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Evaluation of surface passivation layers for bulk lifetime estimation of high resistivity silicon for radiation detectors
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Authors
Rafi, J.M.
;
Cardona-Safont, L.
;
Zabala, M.
;
Boulord, C.
;
Campabadal, F.
;
Pellegrini, G.
;
Lozano, M.
;
Simoen, Eddy
;
Claeys, Cor
Conference
Gettering and Defect Engineering in Semiconductor Technology XII
Title
Evaluation of surface passivation layers for bulk lifetime estimation of high resistivity silicon for radiation detectors
Publication type
Proceedings paper
Embargo date
9999-12-31
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