High-frequency noise performance of 60-nm gate-length FinFETs

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Author(s)

Raskin, Jean-Pierre

;

Pailloncy, Guillaume

;

Lederer, Dimitri

;

Danneville, Francois

;

Dambrine, Gilles

;

Decoutere, Stefaan

;

Mercha, Abdelkarim

;

Parvais, Bertrand

Journal

IEEE Transactions on Electron Devices

Metrics

1902 since deposited on 2021-10-17

Acq. date: 2025-10-26