High-frequency noise performance of 60-nm gate-length FinFETs

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Authors

Raskin, Jean-Pierre; Pailloncy, Guillaume; Lederer, Dimitri; Danneville, Francois; Dambrine, Gilles; Decoutere, Stefaan; Mercha, Abdelkarim; Parvais, Bertrand

ISSN

0018-9383

Issue

10

Journal

IEEE Transactions on Electron Devices

Volume

55

Title

High-frequency noise performance of 60-nm gate-length FinFETs

Publication type

Journal article

Embargo date

9999-12-31

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