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Influence of kink effect on noise measurements at microwave frequencies in InP substrate PHEMTs

dc.contributor.authorRouquette, P.
dc.contributor.authorGasquet, D.
dc.contributor.authorBarberousse, F.
dc.contributor.authorDe Raedt, Walter
dc.contributor.authorBaeyens, Yves
dc.date.accessioned2021-09-29T15:19:56Z
dc.date.available2021-09-29T15:19:56Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1442
dc.sourceIIOimport
dc.titleInfluence of kink effect on noise measurements at microwave frequencies in InP substrate PHEMTs
dc.typeProceedings paper
dc.contributor.imecauthorDe Raedt, Walter
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage165
dc.source.endpage170
dc.source.conferenceProceedings 3rd ELEN Workshop
dc.source.conferencedate5/11/1996
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - open access


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