Show simple item record

Electrical activity of dislocations and defects in strained Si and Ge based devices

dc.contributor.authorSimoen, Eddy
dc.contributor.authorEneman, Geert
dc.contributor.authorVerheyen, Peter
dc.contributor.authorLoo, Roger
dc.contributor.authorBargallo Gonzalez, Mireia
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-17T10:46:13Z
dc.date.available2021-10-17T10:46:13Z
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14473
dc.sourceIIOimport
dc.titleElectrical activity of dislocations and defects in strained Si and Ge based devices
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorLoo, Roger
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage2434
dc.source.conference214th ECS Meeting
dc.source.conferencedate12/10/2008
dc.source.conferencelocationHonolulu, HI USA
imec.availabilityPublished - open access
imec.internalnotesECS Meeting Abstracts; Vol. MA 2008-02


Files in this item

Thumbnail
Name:
17121.pdf
Size:
138.6Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record