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Paramagnetic point defects at interfacial layer in biaxial tensile strained (100)Si/SiO2
Publication:
Paramagnetic point defects at interfacial layer in biaxial tensile strained (100)Si/SiO2
Date
2008
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Somers, P.
;
Stesmans, Andre
;
Afanas'ev, V.V.
;
Claeys, Cor
;
Simoen, Eddy
Journal
Journal of Applied Physics
Abstract
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1962
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1962
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations