dc.contributor.author | Schmidt, Harald | |
dc.contributor.author | Teerlinck, Ivo | |
dc.contributor.author | Storm, Wolfgang | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-09-29T15:22:15Z | |
dc.date.available | 2021-09-29T15:22:15Z | |
dc.date.issued | 1996 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1458 | |
dc.source | IIOimport | |
dc.title | In situ and real time studies of wet chemical silicon cleaning reactions | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 480 | |
dc.source.endpage | 491 | |
dc.source.conference | Proceedings of the4th International Symposium on Cleaning technology in Semiconductor Device Manufacturing | |
dc.source.conferencedate | 9/10/1995 | |
dc.source.conferencelocation | Chicago, IL USA | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Proceedings; Vol. 95-20 | |