Analytical model for point and line tunneling in a tunnel field-effect transistor

Thumbnail
Metadata
Show full item record
Authors
Vandenberghe, William; Verhulst, Anne; Groeseneken, Guido; Soree, Bart; Magnus, Wim
Conference
International Conference on Simulation of Semiconductor Processes and Devices - SISPAD
Title
Analytical model for point and line tunneling in a tunnel field-effect transistor
Publication type
Proceedings paper
Collections