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Phase identification of self-forming Cu-Mn based diffusion barriers on p-SiOC:H and SiO2 dielectrics using x-ray absorption fine structures
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Authors
Ablett, James
;
Woicik, Joseph
;
Tokei, Zsolt
;
List, Scott
;
Dimasi, Elaine
ISSN
0003-6951
Issue
4
Journal
Applied Physics Letters
Volume
94
Title
Phase identification of self-forming Cu-Mn based diffusion barriers on p-SiOC:H and SiO2 dielectrics using x-ray absorption fine structures
Publication type
Journal article
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