Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks

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Authors

Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; De Keersgieter, An; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido

ISSN

1530-4388

Issue

3

Journal

IEEE Transactions on Device and Materials Reliability

Volume

9

Title

Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks

Publication type

Journal article

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