Channel hot-Carrier degradation in short channel devices with high-k/metal gate stacks

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Authors
Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido
Conference
7a Congreso de Dispositivos Electrónicos - 7th Spanish Conference on Electron Devices
Title
Channel hot-Carrier degradation in short channel devices with high-k/metal gate stacks
Publication type
Proceedings paper
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