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Channel hot-Carrier degradation in short channel devices with high-k/metal gate stacks

dc.contributor.authorAmat, Esteve
dc.contributor.authorKauerauf, Thomas
dc.contributor.authorDegraeve, Robin
dc.contributor.authorNafría, Montse
dc.contributor.authorAymerich, Xavier
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-17T21:17:43Z
dc.date.available2021-10-17T21:17:43Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14896
dc.sourceIIOimport
dc.titleChannel hot-Carrier degradation in short channel devices with high-k/metal gate stacks
dc.typeProceedings paper
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.source.peerreviewno
dc.source.conference7a Congreso de Dispositivos Electrónicos - 7th Spanish Conference on Electron Devices
dc.source.conferencedate11/02/2009
dc.source.conferencelocationSantiago de Compostela Spain
imec.availabilityPublished - imec


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