Authors

Amat, Esteve; Kauerauf, Thomas; Degraeve, Robin; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Groeseneken, Guido

ISSN

1530-4388

Issue

3

Journal

IEEE Transactions on Device and Materials Reliability

Volume

9

Title

Competing degradation mechanisms in short-channel transistors under channel hot-carrier stress at elevated temperatures

Publication type

Journal article