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Extended defect related excess low-frequency noise in Si junction diodes

dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorBosman, Gijs
dc.contributor.authorCzerwinsky, A.
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T15:26:28Z
dc.date.available2021-09-29T15:26:28Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1492
dc.sourceIIOimport
dc.titleExtended defect related excess low-frequency noise in Si junction diodes
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage133
dc.source.endpage138
dc.source.conferenceDefect Recognition and Image Processing in Semiconductors - DRIP. Proceedings of the 6th International Conference
dc.source.conferencedate3/12/1995
dc.source.conferencelocationBoulder, CO USA
imec.availabilityPublished - open access
imec.internalnotesIOP Conference Series; Vol. 149


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