Publication:

Correlation of fin shape fluctuations to FinFET electrical variability and noise margins of 6-T SRAM cells

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1870 since deposited on 2021-10-17
1last month
Acq. date: 2026-06-03

Citations

Statistics

Views

1870 since deposited on 2021-10-17
1last month
Acq. date: 2026-06-03

Citations