Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Characterization of plasma damage in low-k films by TVS measurements
Publication:
Characterization of plasma damage in low-k films by TVS measurements
Copy permalink
Date
2009
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ciofi, Ivan
;
Baklanov, Mikhaïl
;
Calbo, Giovanni
;
Tokei, Zsolt
;
Beyer, Gerald
Journal
Abstract
Description
Statistics
Views
1871
since deposited on 2021-10-17
1
last month
Acq. date: 2026-02-25
Citations
Statistics
Views
1871
since deposited on 2021-10-17
1
last month
Acq. date: 2026-02-25
Citations