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Reliability performance characterization of SOI FinFETs

dc.contributor.authorClaeys, Cor
dc.contributor.authorPut, Sofie
dc.contributor.authorRafi, J.M.
dc.contributor.authorPavanello, J.M.
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-17T21:37:34Z
dc.date.available2021-10-17T21:37:34Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15112
dc.sourceIIOimport
dc.titleReliability performance characterization of SOI FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference2nd International Workshop on Electron Devices and Semiconductor Technology - IEDST
dc.source.conferencedate1/06/2009
dc.source.conferencelocationMumbai India
imec.availabilityPublished - open access


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