The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks

Thumbnail
View/open
Metadata
Show full item record
Authors
Crupi, F.; Magnone, P.; Simoen, Eddy; Pantisano, Luigi; Giusi, G.; Pace, C.; Claeys, Cor
Conference
215th ECS Meeting
Title
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Publication type
Meeting abstract
Embargo date
9999-12-31
Collections