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Articles
Effect of substrate charging on the reliability of capacitive RF MEMS switches
Publication:
Effect of substrate charging on the reliability of capacitive RF MEMS switches
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Date
2009
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Czarnecki, Piotr
;
Rottenberg, Xavier
;
Soussan, Philippe
;
Ekkels, Phillip
;
Muller, Philippe
;
Nolmans, Philip
;
De Raedt, Walter
;
Tilmans, Harrie
;
Puers, Bob
;
Marchand, Laurent
;
De Wolf, Ingrid
Journal
Sensors and Actuators A: Physical
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1964
since deposited on 2021-10-17
Acq. date: 2025-12-10
Citations
Metrics
Views
1964
since deposited on 2021-10-17
Acq. date: 2025-12-10
Citations