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Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique
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Authors
Degraeve, Robin
;
Zahid, Mohammed
;
Van den Bosch, Geert
;
Blomme, Pieter
;
Breuil, Laurent
;
Kaczer, Ben
;
Mercuri, Marco
;
Rothschild, Aude
;
Cacciato, Antonio
;
Jurczak, Gosia
;
Groeseneken, Guido
;
Van Houdt, Jan
Conference
International Conference on Solid State Devices and Materials - SSDM
Title
Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique
Publication type
Proceedings paper
Embargo date
9999-12-31
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