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Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique

dc.contributor.authorDegraeve, Robin
dc.contributor.authorZahid, Mohammed
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorBlomme, Pieter
dc.contributor.authorBreuil, Laurent
dc.contributor.authorKaczer, Ben
dc.contributor.authorMercuri, Marco
dc.contributor.authorRothschild, Aude
dc.contributor.authorCacciato, Antonio
dc.contributor.authorJurczak, Gosia
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-17T21:53:50Z
dc.date.available2021-10-17T21:53:50Z
dc.date.issued2009-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15212
dc.sourceIIOimport
dc.titleExplanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique
dc.typeProceedings paper
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorBlomme, Pieter
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorMercuri, Marco
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.conferenceInternational Conference on Solid State Devices and Materials - SSDM
dc.source.conferencedate7/10/2009
dc.source.conferencelocationSendai Japan
imec.availabilityPublished - open access


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