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Nanoscale electrical characterization of CuTCNQ layers by conductive AFM in view of their use as resistive random access memory (RRAM)
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1934 since deposited on 2021-10-17
1last month
Acq. date: 2026-05-16
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Statistics
Views
1934 since deposited on 2021-10-17
1last month
Acq. date: 2026-05-16
Citations