dc.contributor.author | Deleruyelle, Damien | |
dc.contributor.author | Thomas, Maryline | |
dc.contributor.author | Muller, Christophe | |
dc.contributor.author | Muller, Robert | |
dc.contributor.author | Goux, Ludovic | |
dc.contributor.author | Wouters, Dirk | |
dc.contributor.author | Kever, Thorsten | |
dc.contributor.author | Boettger, Ulrich | |
dc.contributor.author | Waser, Rainer | |
dc.date.accessioned | 2021-10-17T21:55:03Z | |
dc.date.available | 2021-10-17T21:55:03Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15218 | |
dc.source | IIOimport | |
dc.title | Nanoscale electrical characterization of CuTCNQ layers by conductive AFM in view of their use as resistive random access memory (RRAM) | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.source.peerreview | no | |
dc.source.conference | E-MRS Spring Meeting Symposium G: Fundamentals and Technology of Multifunctional Oxide Thin Films | |
dc.source.conferencedate | 8/06/2009 | |
dc.source.conferencelocation | Strasbourg France | |
imec.availability | Published - imec | |